Atomic Force Microscopy in Process Engineering : An Introduction to AFM for Improved Processes and Products

This is the first book to bring together both the basic theory and proven process engineering practice of AFM. It is presented in a way that is accessible and valuable to practising engineers as well as to those who are improving their AFM skills and knowledge, and to researchers who are developing new products and solutions using AFM. The book takes a rigorous and practical approach that ensures it is directly applicable to process engineering problems. Fundamentals and techniques are concisely described, while specific benefits for process engineering are clearly defined and illustrated. Key content includes: particle-particle, and particle-bubble interactions; characterization of membrane surfaces; the development of fouling resistant membranes; nanoscale pharmaceutical analysis; nanoengineering for cellular sensing; polymers on surfaces; micro and nanoscale rheometry. - Atomic force microscopy (AFM) is an important tool for process engineers and scientists as it enables improved processes and products - The only book dealing with the theory and practical applications of atomic force microscopy in process engineering - Provides best-practice guidance and experience on using AFM for process and product improvement Cover Page ......Page 1 Copyright Page ......Page 2 Preface ......Page 3 About the Editors......Page 7 List of Contributors......Page 9 Basic Principles of Atomic Force Microscopy......Page 11 Introduction......Page 12 The atomic force microscope......Page 13 Cantilevers and probes......Page 16 Effect of Probe Geometry......Page 17 Imaging modes......Page 18 Contact Mode Imaging......Page 19 Non-Contact Mode......Page 20 Force Volume Imaging......Page 21 The AFM as a force sensor......Page 22 Calibration of Normal Spring Constants......Page 26 Calibration of Torsional and Lateral Spring Constants......Page 31 Colloid probes......Page 32 Abbreviations and Symbols......Page 33 References ......Page 34 Measurement of Particle and Surface Interactions Using Force Microscopy......Page 41 Colloid Probes......Page 42 van der Waals Forces......Page 45 Electrical Double Layer Forces......Page 54 DLVO T heory......Page 63 Solvation Forces......Page 68 Steric Interaction Forces......Page 72 Hydrophobic Interaction Forces......Page 73 Effect of Hydrodynamic Drag on AFM Force Measurements......Page 76 Contact Mechanics and Adhesion......Page 77 Abbreviations and Symbols......Page 80 Greek symbols......Page 83 References......Page 84 Quantification of Particle–Bubble Interactions Using Atomic Force Microscopy......Page 91 Particle–bubble interactions......Page 92 Determination of particle–bubble separation......Page 96 Determination of contact angle from force–distance curves......Page 98 Effect of Particle Surface Chemistry on Particle–Bubble Interactions......Page 101 Effect of Surfactant on Particle–Bubble Interactions......Page 104 Effect of loading force on particle–bubble interactions......Page 107 Effect of hydrodynamics on particle–bubble interactions......Page 108 Conclusions......Page 110 List of symbols......Page 111 References......Page 112 Investigating Membranes and Membrane Processes with Atomic Force Microscopy......Page 116 Introduction......Page 117 The range of possibilities for investigating membranes......Page 118 Correspondence between surface pore dimensions from AFM and MWCO......Page 122 Imaging in liquid and the determination of surface electrical properties......Page 125 Effects of surface roughness on interactions with particles......Page 129 ‘Visualisation’ of the rejection of a colloid by a membrane pore and critical flux......Page 132 The use of AFM in membrane development......Page 133 Characterisation of metal surfaces......Page 135 Effect of Electropolishing of Steel Surfaces......Page 139 Corrosion of Metal Surfaces......Page 141 Conclusions......Page 144 References ......Page 145 Introduction......Page 148 Measurement of adhesion of colloidal particles and cells to membrane surfaces......Page 150 Modification of Membranes with Quaternary Ammonium Salts......Page 153 Membrane Characterisation......Page 154 (Bio)Adhesion Forces between a BSA-Functionalised Colloid Probe and Membrane Surface......Page 160 Modification of membranes with sulphonated poly (ether-ether ketone) polymers......Page 172 Acknowledgements......Page 177 References......Page 178 Introduction......Page 181 The AFM as a force measurement tool in pharmaceuticals......Page 182 Particle Interaction Measurements......Page 183 Mechanical Properties from Single-particle Measurements......Page 187 AFM imaging-based studies......Page 191 Micro- and nanothermal characterisation with SPM......Page 193 Abbreviations and Symbols......Page 198 References......Page 199 Introduction......Page 203 How Do Cells Respond to the ECM?......Page 204 Engineering the ECM for probing cell sensing......Page 206 Surface Patterning (Chemical Signals)......Page 207 Nanotopography......Page 213 Nanoscale Measurement: Challenges and Opportunities for AFM......Page 217 AFM Imaging of Cells......Page 219 Elasticity Measurement of Living Cells......Page 222 Conclusions......Page 225 Abbreviations and Symbols......Page 227 References......Page 228 Introduction......Page 233 Basic concepts......Page 235 End-grafted polymer chains......Page 237 Diblock copolymers adsorbed on surfaces......Page 244 Star-shaped polymers adsorbed on surfaces......Page 245 Conclusions......Page 248 Acknowledgements......Page 249 References......Page 250 Introduction......Page 253 Dynamic AFM methods for the characterisation of material properties......Page 257 Dynamic modulation studies on confined fluids......Page 260 Determination of rheological properties from resonance spectra......Page 264 Cavitation and adhesive failure of thin films......Page 267 Mesoscale experimental studies of the tensile behaviour of thin fluid films......Page 269 List of Symbols......Page 277 References......Page 278 Future Prospects......Page 283 E ......Page 288 N ......Page 289 Z ......Page 290

This is the first book to bring together both the basic theory and proven process engineering practice of AFM. It is presented in a way that is accessible and valuable to practising engineers as well as to those who are improving their AFM skills and knowledge, and to researchers who are developing new products and solutions using AFM.

The book takes a rigorous and practical approach that ensures it is directly applicable to process engineering problems. Fundamentals and techniques are concisely described, while specific benefits for process engineering are clearly defined and illustrated. Key content includes: particle-particle, and particle-bubble interactions; characterization of membrane surfaces; the development of fouling resistant membranes; nanoscale pharmaceutical analysis; nanoengineering for cellular sensing; polymers on surfaces; micro and nanoscale rheometry.

• Atomic force microscopy (AFM) is an important tool for process engineers and scientists as it enables improved processes and products
• The only book dealing with the theory and practical applications of atomic force microscopy in process engineering
• Provides best-practice guidance and experience on using AFM for process and product improvement

Atomic force microscopy (AFM) is a surface imaging technique that can be applied at sub-nanometre resolution in liquids and gases. The same instrumentation can also be used to quantify directly the forces of interfacial interaction in such environments and is therefore a critical tool for process engineers and scientists, where AFM investigations are leading directly to improved processes and products. This is the first book to bring together both the basic theory and proven process engineering practice of AFM, and to present them in a way that is accessible and valuable to practising engineers, those who are improving their AFM skills and knowledge, and researchers who are developing new products and solutions using AFM. The book takes a rigorous but practical approach to ensure that it is also directly applicable to practical process engineering problems. Fundamentals of the techniques are concisely described and specific benefits for process engineering clearly defined and illustrated. Coverage of applications of AFM to important areas of process engineering is comprehensive. Each of the chapter authors are recognized authorities on their subject