Electron Microscopy: A Versatile Tool for Material Characterization

This book looks at electron microscopy in a comprehensive way covering different types of microscope (SEM, TEM, etc.) and operating mode (HREM, CBED, HAADF, EELS, etc.). It is not a textbook but a student companion. In addition to explaining the subject, it selects important terminology and explain further, keeping in mind the level comprehensible by graduate/under-graduate students. The complex mathematics behind electron microscopy is avoided but explained in a simplified way. The students are referred to original ideas and related sources. They are advised to look at textbooks to broaden knowledge. Acknowledgements Foreword 1 Introduction References 2 Historical Timelines 3 Electron Beam Interaction with Materials 3.1 Electron Scattering 3.2 Electron Diffraction 3.3 X-ray Generation 3.4 References 4 Instrumentation 4.1 Electron Sources 4.2 Electron Optics 4.3 Electron and X-ray Detectors 4.4 References 5 Microscope Types and Operating Modes 5.1 Transmission Electron Microscope 5.2 Scanning Electron Microscope 5.3 Operating Modes in TEM and SEM 5.4 References 6 Microscopy and Analysis 6.1 Imaging 6.2 Diffraction 6.3 Analysis 6.4 References Endnotes About the author About the reviewer: Prof. Dr. Gerhard Schumacher About the reviewer: Dr Partha Ghosal Review by DR PARTHA GHOSAL