Field Emission In Vacuum Microelectronics (microdevices)

Field emission is a phenomenon described by quantum mechanics. Its emission capability is millions times higher than that of any other known types of electron emission. Nowadays this phenomenon is experiencing a new life due to wonderful applications in the atomic resolution microscopy, in electronic holography, and in the vacuum micro- and nanoelectronics in general. The main field emission properties, and some most remarkable experimental facts and applications, are described in this book. Field electron emission (FEE) is a unique quantum-mechanical effect of electrons tunneling from a condensed matter (solid or liquid) into a vacuum. The efficiency of this emission process is tens of millions of times higher than in other known emission processes. The extremely high current density in FEE and the fact that no energy is consumed by the emission process proper afford exceptionally wide possibilities for practical application of this effect.Currently, FEE is being infused with new life due to the emergence of vacuum microelectronics, a principally new branch of micro- and nano-electronics. Point field emission cathodes (FECs) find novel applications in fine-resolution electron microscopy, Auger spectroscopy, atomic-resolution electron holography, and other areas of superfine diagnostics of atomic surfaces.FEE is also a process capable of initiating and sustaining the generation of high power and super high-power electron beams (thousands and millions of amperes) through a phenomenon called explosion electron emission, which is the basis of modern high-current electronics.This book presents the phenomenon of FEE per se, its governing relationships, attainable parameters of the field emission process, and its application to problems of vacuum microelectronics. "Field electron emission (FEE) is a unique quantum-mechanical effect of electrons tunneling from a condensed matter (solid or liquid) into a vacuum. This book presents the phenomenon of FEE per se, its governing relationships, attainable parameters of the field emission process, and its application to problems of vacuum microelectronics."--Jacket By George Fursey ; Edited By Ivor Brodie, Paul Schwoebel.