Long-Term Reliability of Nanometer VLSI Systems : Modeling, Analysis and Optimization

This book provides readers with a detailed reference regarding two of the most important long-term reliability and aging effects on nanometer integrated systems, electromigrations (EM) for interconnect and biased temperature instability (BTI) for CMOS devices. The authors discuss in detail recent developments in the modeling, analysis and optimization of the reliability effects from EM and BTI induced failures at the circuit, architecture and system levels of abstraction. Readers will benefit from a focus on topics such as recently developed, physics-based EM modeling, EM modeling for multi-segment wires, new EM-aware power grid analysis, and system level EM-induced reliability optimization and management techniques. * Reviews classic Electromigration (EM) models, as well as existing EM failure models and discusses the limitations of those models; * Introduces a dynamic EM model to address transient stress evolution, in which wires are stressed under time-varying current flows, and the EM recovery effects. Also includes new, parameterized equivalent DC current based EM models to address the recovery and transient effects; * Presents a cross-layer approach to transistor aging modeling, analysis and mitigation, spanning multiple abstraction levels; * Equips readers for EM-induced dynamic reliability management and energy or lifetime optimization techniques, for many-core dark silicon microprocessors, embedded systems, lower power many-core processors and datacenters. Front Matter ....Pages i-xli Front Matter ....Pages 1-1 Introduction (Sheldon Tan, Mehdi Tahoori, Taeyoung Kim, Shengcheng Wang, Zeyu Sun, Saman Kiamehr)....Pages 3-12 Physics-Based EM Modeling (Sheldon Tan, Mehdi Tahoori, Taeyoung Kim, Shengcheng Wang, Zeyu Sun, Saman Kiamehr)....Pages 13-45 Fast EM Stress Evolution Analysis Using Krylov Subspace Method (Sheldon Tan, Mehdi Tahoori, Taeyoung Kim, Shengcheng Wang, Zeyu Sun, Saman Kiamehr)....Pages 47-66 Fast EM Immortality Analysis for Multi-Segment Copper Interconnect Wires (Sheldon Tan, Mehdi Tahoori, Taeyoung Kim, Shengcheng Wang, Zeyu Sun, Saman Kiamehr)....Pages 67-96 Dynamic EM Models for Transient Stress Evolution and Recovery (Sheldon Tan, Mehdi Tahoori, Taeyoung Kim, Shengcheng Wang, Zeyu Sun, Saman Kiamehr)....Pages 97-120 Compact EM Models for Multi-Segment Interconnect Wires (Sheldon Tan, Mehdi Tahoori, Taeyoung Kim, Shengcheng Wang, Zeyu Sun, Saman Kiamehr)....Pages 121-151 EM Assessment for Power Grid Networks (Sheldon Tan, Mehdi Tahoori, Taeyoung Kim, Shengcheng Wang, Zeyu Sun, Saman Kiamehr)....Pages 153-175 Resource-Based EM Modeling DRM for Multi-Core Microprocessors (Sheldon Tan, Mehdi Tahoori, Taeyoung Kim, Shengcheng Wang, Zeyu Sun, Saman Kiamehr)....Pages 177-194 DRM and Optimization for Real-Time Embedded Systems (Sheldon Tan, Mehdi Tahoori, Taeyoung Kim, Shengcheng Wang, Zeyu Sun, Saman Kiamehr)....Pages 195-215 Learning-Based DRM and Energy Optimization for Manycore Dark Silicon Processors (Sheldon Tan, Mehdi Tahoori, Taeyoung Kim, Shengcheng Wang, Zeyu Sun, Saman Kiamehr)....Pages 217-245 Recovery-Aware DRM for Near-Threshold Dark Silicon Processors (Sheldon Tan, Mehdi Tahoori, Taeyoung Kim, Shengcheng Wang, Zeyu Sun, Saman Kiamehr)....Pages 247-262 Cross-Layer DRM and Optimization for Datacenter Systems (Sheldon Tan, Mehdi Tahoori, Taeyoung Kim, Shengcheng Wang, Zeyu Sun, Saman Kiamehr)....Pages 263-275 Front Matter ....Pages 277-277 Introduction (Sheldon Tan, Mehdi Tahoori, Taeyoung Kim, Shengcheng Wang, Zeyu Sun, Saman Kiamehr)....Pages 279-304 Aging-Aware Timing Analysis (Sheldon Tan, Mehdi Tahoori, Taeyoung Kim, Shengcheng Wang, Zeyu Sun, Saman Kiamehr)....Pages 305-321 Aging-Aware Standard Cell Library Optimization Methods (Sheldon Tan, Mehdi Tahoori, Taeyoung Kim, Shengcheng Wang, Zeyu Sun, Saman Kiamehr)....Pages 323-342 Aging Effects in Sequential Elements (Sheldon Tan, Mehdi Tahoori, Taeyoung Kim, Shengcheng Wang, Zeyu Sun, Saman Kiamehr)....Pages 343-356 Aging Guardband Reduction Through Selective Flip-Flop Optimization (Sheldon Tan, Mehdi Tahoori, Taeyoung Kim, Shengcheng Wang, Zeyu Sun, Saman Kiamehr)....Pages 357-372 Workload-Aware Static Aging Monitoring and Mitigation of Timing-Critical Flip-Flops (Sheldon Tan, Mehdi Tahoori, Taeyoung Kim, Shengcheng Wang, Zeyu Sun, Saman Kiamehr)....Pages 373-399 Aging Relaxation at Microarchitecture Level Using Special NOPs (Sheldon Tan, Mehdi Tahoori, Taeyoung Kim, Shengcheng Wang, Zeyu Sun, Saman Kiamehr)....Pages 401-414 ExtraTime: Modeling and Analysis of Transistor Aging at Microarchitecture-Level (Sheldon Tan, Mehdi Tahoori, Taeyoung Kim, Shengcheng Wang, Zeyu Sun, Saman Kiamehr)....Pages 415-438 Reducing Processor Wearout by Exploiting the Timing Slack of Instructions (Sheldon Tan, Mehdi Tahoori, Taeyoung Kim, Shengcheng Wang, Zeyu Sun, Saman Kiamehr)....Pages 439-455 Back Matter ....Pages 457-460