Multiple-voltage CMOS circuit design

This book presents an in-depth treatment of various power reduction and speed enhancement techniques based on multiple supply and threshold voltages. A detailed discussion of the sources of power consumption in CMOS circuits will be provided whilst focusing primarily on identifying the mechanisms by which sub-threshold and gate oxide leakage currents are generated. The authors present a comprehensive review of state-of-the-art dynamic, static supply and threshold voltage scaling techniques and discuss the pros and cons of supply and threshold voltage scaling techniques.Content: Chapter 1 Introduction (pages 1–17): Chapter 2 Sources of Power Consumption in CMOS ICs (pages 19–43): Chapter 3 Supply and Threshold Voltage Scaling Techniques (pages 45–84): Chapter 4 Low?Voltage Power Supplies (pages 85–97): Chapter 5 Buck Converters for On?Chip Integration (pages 99–113): Chapter 6 Low?Voltage Swing Monolithic DC–DC Conversion (pages 115–126): Chapter 7 High Input Voltage Step?Down DC–DC Converters (pages 127–138): Chapter 8 Signal Transfer in ICs with Multiple Supply Voltages (pages 139–146): Chapter 9 Domino Logic with Variable Threshold Voltage Keeper (pages 147–170): Chapter 10 Subthreshold Leakage Current Characteristics of Dynamic Circuits (pages 171–186): Chapter 11 Sleep Switch Dual Threshold Voltage Domino Logic (pages 187–204): Chapter 12 Conclusions (pages 205–210):

This book presents an in-depth treatment of various power reduction and speed enhancement techniques based on multiple supply and threshold voltages. A detailed discussion of the sources of power consumption in CMOS circuits will be provided whilst focusing primarily on identifying the mechanisms by which sub-threshold and gate oxide leakage currents are generated. The authors present a comprehensive review of state-of-the-art dynamic, static supply and threshold voltage scaling techniques and discuss the pros and cons of supply and threshold voltage scaling techniques.

Dr Volkan Kursun, Department of Electrical & Computer Engineering, University of Rochester, Rochester, New York 14627-0231, USA Professor Dr Eby Friedman, Department of Electrical & Computer Engineering, University of Rochester, Rochester, New York 14627-0231, USA The scaling of semiconductor process technologies has been continuing for more than four decades.