This publication is a compilation of papers presented at the Semiconductor Device Reliabi lity Workshop sponsored by the NATO International Scientific Exchange Program. The Workshop was held in Crete, Greece from June 4 to June 9, 1989. The objective of the Workshop was to review and to further explore advances in the field of semiconductor reliability through invited paper presentations and discussions. The technical emphasis was on quality assurance and reliability of optoelectronic and high speed semiconductor devices. The primary support for the meeting was provided by the Scientific Affairs Division of NATO. We are indebted to NATO for their support and to Dr. Craig Sinclair, who admin isters this program. The chapters of this book follow the format and order of the sessions of the meeting. Thirty-six papers were presented and discussed during the five-day Workshop. In addi tion, two panel sessions were held, with audience participation, where the particularly controversial topics of bum-in and reliability modeling and prediction methods were dis cussed. A brief review of these sessions is presented in this book. Front Matter....Pages i-ix The Influence of Temperature and Use Conditions on the Degradation of Led Parameters....Pages 1-28 An Historical Perspective of GaAs Mesfet Reliability Work at Plessey....Pages 29-42 Screening and burn-in: application to optoelectronic device selection for high-reliability S 280 optical submarine repeaters....Pages 43-73 Assuring the Reliability of Lasers Intended for the Uncontrolled Environment....Pages 75-96 Component Burn-In: The Changing Attitude....Pages 97-106 Statistical Models for Device Reliability; An Overview....Pages 107-125 Computer-Aided Analysis of Integrated Circuit Reliability....Pages 127-136 Reliability Assessment of Cmos Asic Designs....Pages 137-146 Models Used in Undersea Fibre Optic Systems Reliability Prediction....Pages 147-160 Failure Analysis: The Challenge....Pages 161-175 Gate Metallisation Systems for High Reliability GaAs MESFET Transistors....Pages 177-196 Reliability Limitations of Metal Electrodes on GaAs....Pages 197-210 Failure Mechanisms of GaAs MESFETs and Low-Noise HEMTs....Pages 211-267 Metal Contact Degradation on III–V Compound Semiconductors....Pages 269-289 Nuclear Methods in the Characterization of Semiconductor Reliability....Pages 291-300 A Review of the Reliability of III–V Opto-electronic Components....Pages 301-319 Considerations on the Degradation of DFB Lasers....Pages 321-328 InP-Based 4 × 4 Optical Switch Package Qualification and Reliability....Pages 329-342 Modelling the Effects of Degradation on the Spectral Stability of Distributed Feedback Lasers....Pages 343-352 Optoelectronic Component Reliability and Failure Analysis....Pages 353-362 Temperature Cycling Tests o Laser Modules....Pages 363-378 An Experimental and Theoretical Investigation of Degradation in Semiconductor Lasers Resulting from Electrostatic Discharge....Pages 379-411 Reliability Testing of Planar InGaAs Avalanche Photodiodes....Pages 413-421 Status of Compound Semiconductor Device Reliability....Pages 423-437 Investigation into Molecular Beam Epitaxy-Grown FETs and HEMTs....Pages 439-453 Reliability of GaAs MESFETs....Pages 455-469 Hydrogen Effects on Reliability of GaAs MMICs....Pages 471-477 Temperature Distribution on GaAs MESFETs: Thermal Modeling and Experimental Results....Pages 479-489 High Speed IC Reliability : Concerns and Advances....Pages 491-506 Reliability of Short Channel Silicon and SOI VLSI Devices and Circuits....Pages 507-516 Special Reliability Issues and Radiation Effects of High Speed I.C. s....Pages 517-544 Reliability of High Speed HEMT Integrated Circuits and Multi-2DEG Structures....Pages 545-556 AlGaAs as a Dielectric on GaAs for Digital I.C.’s: Problems and Solutions....Pages 557-568 Back Matter....Pages 569-575 Proceedings of the NATO Advanced Research Workshop, Heraklion, Crete, Greece, June 4-9, 1989
