Systematic materials analysis / Vol. 4

Systematic Materials Analysis, Volume IV presents refined instrumental methods available for materials analysis, which involves the complete characterization of a material, including structural and textural analyses in addition to chemical analysis. This volume is composed of 11 chapters. Each chapter on specific instruments outlines the theories of operation and describes their capability for qualitative and quantitative measurements of chemical composition, structure, and texture. The sensitivity and selectivity of each method are emphasized. The specific techniques and instruments covered in this book include the atomic-absorption and atomic-fluorescence flame photometry, ion microprobe, mass spectrometry, neutron diffractometry, polarimetry, polarography, dynamic thermal analysis, and transmission electron microscopy. This book is intended primarily to materials analysts, engineers, researchers, and undergraduate and graduate level students. Content: MATERIALS SCIENCE AND TECHNOLOGY , Page ii Front Matter , Page iii Copyright , Page iv Dedication , Page v List of Contributors , Pages xi-xii Preface , Pages xiii-xiv Acknowledgments , Page xv Contents of Other Volumes , Pages xvii-xviii CHAPTER 30 - Atomic-Absorption and Atomic-Fluorescence Flame Photometry , Pages 1-51 , Juan Ramírez-Muñoz CHAPTER 31 - Ion Microprobe , Pages 53-89 , T.A. Whatley, E. Davidson CHAPTER 32 - Mass Spectrometry , Pages 91-131 , Ronald F. Skinner, Elaine Heron CHAPTER 33 - Molecular Weight Determinations , Pages 133-151 , R.V. Peterson CHAPTER 34 - Neutron Diffractometry , Pages 153-182 , Melvin H. Mueller CHAPTER 35 - Particulate Characterization , Pages 183-203 , Shepard Kinsman CHAPTER 36 - Polarimetry , Pages 205-224 , J.H. Richardson CHAPTER 37 - Polarography and Related Methods , Pages 225-268 , Petr Zuman CHAPTER 38 - Methods for the Detection of Noncentrosymmetry in Solids , Pages 269-342 , S.K. Kurtz, J.P. Dougherty CHAPTER 39 - Technique of Materials Analysis—Dynamic Thermal Analysis , Pages 343-405 , E.M. Barrall II, R.J. Gritter CHAPTER 40 - Transmission Electron Microscopy , Pages 407-475 , James C. Williams, Neil Paton Author Index , Pages 477-487 Subject Index , Pages 488-493