X-Ray Diffraction by Polycrystalline Materials : Instrumentation and Microstructural Analysis

This book presents a physical approach to the diffraction phenomenon and its applications in materials science. An historical background to the discovery of X-ray diffraction is first outlined. Next, Part 1 gives a description of the physical phenomenon of X-ray diffraction on perfect and imperfect crystals. Part 2 then provides a detailed analysis of the instruments used for the characterization of powdered materials or thin films. The description of the processing of measured signals and their results is also covered, as are recent developments relating to quantitative microstructural analysis of powders or epitaxial thin films on the basis of X-ray diffraction. Given the comprehensive coverage offered by this title, anyone involved in the field of X-ray diffraction and its applications will find this of great use. This book presents a physical approach to the diffraction phenomenon and its applications in materials science. Part One is a historical presentation of the discovery of X-ray diffraction. Part Two is devoted to a description of the physical phenomenon of X-ray diffraction on perfect and imperfect crystals. A detailed analysis of the instruments used for the characterization of powdered materials or thin films is proposed in part three. The description of the processing of measured signals and their results is given. In the final part, the author presents recent developments relating to quantitative microstructural analysis of powders or epitaxial thin films on the basis of X-ray diffraction