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دانشجوعلاقه‌مند یادگیری
کتابخوان حرفه‌ایلذت مطالعه
نویسندهالهام‌گیری

X-ray diffraction : modern experimental techniques

Oliver H Seeck; Bridget M Murphy

قیمت نهایی

۴۴٬۰۰۰ تومان۴۹٬۰۰۰ تومان۱۰٪ تخفیف
  • تخفیف زمان‌دار−۵٬۰۰۰ تومان

۵٬۰۰۰ تومان صرفه‌جویی نسبت به قیمت اصلی

نسخه اصلی و اورجینال

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تحویل فوری
پرداخت امن
ضمانت فایل
پشتیبانی

مشخصات کتاب

سال انتشار
۲۰۱۴
فرمت
PDF
زبان
انگلیسی
حجم فایل
۳۱ مگابایت
شابک
9780429071898، 9789814303590، 9789814303606، 0429071892، 9814303593، 9814303607

دربارهٔ کتاب

High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interface investigations of solid and liquid matter with up-to-date research examples. It presents important characteristics of the sources, experimental set-up, and new detector developments. The book also considers future exploitation of x-ray free electron lasers for diffraction applications. "This book provides an overview of techniques for exploring materials properties on the molecular scale based on X-ray diffraction and scattering methods available at modern third-generation synchrotron radiation sources. Techniques for bulk and interface investigations of solid and liquid matter are discussed and illustrated by current research examples. The important characteristics of the X-ray sources and experimental strategies are presented along with new possibilities such as X-ray free electron lasers."--Page 4 of cover Developments in nature and materials sciences are based on the investigation and understanding of nano-scaled properties of matter. This book presents the developments in X-ray diffraction and scattering methods.

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۴۴٬۰۰۰ تومان