Advanced Production Testing of RF, SoC, and SiP Devices

Featuring invaluable input from industry-leading companies and highly-regarded experts in the field, this first-of-its kind resource offers experienced engineers a comprehensive understanding of the advanced topics in RF, SiP (system-in-package), and SoC (system-on-a-chip) production testing that are critical to their work involving semiconductor devices. The book covers key measurement concepts for semiconductor device testing and assists engineers in explaining these concepts to management to aid in the reduction of project cost, time, and resources. Based on real-world experience and packed with time-saving equations, this in-depth volume offers professionals practical information on essential topics that have never been presented in a single reference before. Engineers Kelly and Engelhardt present a follow-up to the 2004 Production Testing of RF and System-on-a-Chip Devices for Wireless Communications by Keith Schaub and Joe Kelly. They explain more advanced topics in testing radio-frequency (RF) and system-on-a-chip (SoC) devices and the peripherals associated with that testing. They write primarily for applications engineers, engineering managers, product engineers, and students who have either digested the earlier book or otherwise acquired the fundamentals. Annotation 2007 Book News, Inc., Portland, OR (booknews.com)