Advances in X-Ray Analysis : Volume 23

Content: Front Matter....Pages i-xvii Some Applications of Energy Dispersive X-Ray Fluorescence Analysis in Minerals Exploration, Mining and Process Control....Pages 1-13 Analysis of Magnesium Brines by Energy Dispersive XRF....Pages 15-18 Portable X-Ray Fluorescence Analyzers and their Use in an Underground Exploration Program for Tin....Pages 19-25 Applications of a New Multielement Portable X-Ray Spectrometer to Materials Analysis....Pages 27-36 In Situ Rock Analysis....Pages 37-43 Rapid Determination of Ash in Coal by Compton Scattering, Ca, and Fe X-Ray Fluorescence....Pages 45-55 On-Site Determination of Ash in Coal Utilizing a Portable Xrf Analyzer....Pages 57-63 Routine Energy Dispersive Analysis of Sulfur in Coal....Pages 65-69 Application of the Fundamental Parameters Model to Energy-Dispersive X-Ray Fluorescence Analysis of Complex Silicates....Pages 71-76 Elemental Analysis of Uraniferous Rocks and Ores by X-Ray Spectrometry....Pages 77-80 The Fast Analysis of Uranium Ore by EDXRF....Pages 81-86 A Comprehensive Alpha Coefficient Algorithm....Pages 87-92 Fundamental-Parameters Calculations on a Laboratory Microcomputer....Pages 93-97 Modified NRLXRF Program for Energy Dispersive X-Ray Fluorescence Analysis....Pages 99-110 Unusual Matrix Fluorescence Effects in X-Ray Fluorescence Analysis....Pages 111-115 Monte Carlo Simulation Of Sample Scattering Effects From Homogeneous Samples Excited By Monoenergetic Photons....Pages 117-124 The Application Of Digital Filters To The Analysis Of Ge And Si(Li) Detector X-Ray Spectra....Pages 125-131 X-Ray Spectrometric Determination of Sulfate In Natural Waters....Pages 133-141 Application Of The Pixe Method In Atmospheric Aerosol....Pages 143-148 Computer Code for Analysing X-Ray Fluorescence Spectra of Airborne Particulate Matter....Pages 149-156 Energy Dispersive X-Ray Fluorescence (EDXRF) Analysis as a Reliable Nondestructive Industrial Tool....Pages 157-161 Nondestructive, Energy-Dispersive, X-Ray Fluorescence Analysis of Actinide Stream Concentrations from Reprocessed Nuclear Fuel....Pages 163-176 Direct Determination of Niobium in Uranium-Niobium Alloys....Pages 177-183 X-Ray Study of the Band Structure in Stannic Oxide....Pages 185-191 Energy Dispersive XRF Composition Profiling Using Crystal Collimated Incident Radiation....Pages 193-201 Energy Dispersive X-Ray Fluorescence Analysis of Inks on Paper....Pages 203-207 Determination of the Thickness OF SiO2-Layers on Si by X-Ray Analysis and by X-Ray Photoelectron Spectroscopy....Pages 209-217 The Effective Use of Filters with Direct Excitation of EDXRF....Pages 219-222 A Plasma Controlled X-Ray Tube....Pages 223-230 X-Ray Fluorescence Analysis at Room Temperature with an Energy Dispersive Mercuric Iodide Spectrometer (1)....Pages 231-239 New Mold Design for Casting Fused Samples....Pages 241-247 X-Ray Imaging....Pages 249-256 The Search-Match Problem....Pages 257-261 A Computer Aided Search/Match System for Qualitative Powder Diffractometry....Pages 263-272 A Second Derivative Algorithm for Identification of Peaks in Powder Diffraction Patterns....Pages 273-278 Advances in the Computer Indexing of Powder Patterns....Pages 279-285 Specplot - An Interactive Data Reduction and Display Program for Spectral Data....Pages 287-293 A Minicomputer and Methodology for X-Ray Analysis....Pages 295-303 Fracture Surface Analysis of Ball Bearing Steel by X-Ray Residual Stress Measurement....Pages 305-311 A Position-Sensitive Proportional Counter for Residual Stress Measurement by Means of Microbeam X-Rays....Pages 313-316 Stress Analysis in Graphite/Epoxy....Pages 317-323 Problems Associated with K? Doublet in Residual Stress Measurements....Pages 325-330 Inclination of Principal Residual Stress and the Direction of Cracking in Contact-Fatigued Ball Bearing Steel....Pages 331-332 The Generalisation and Refinement of the Vector Method for the Texture Analysis of Polycrystalline Materials....Pages 333-339 The Fitting of Powder Diffraction Profiles to an Analytical Expression and the Influence of Line Broadening Factors....Pages 341-348 Quantitative Phase Analysis of Synthetic Silicon Nitride by X-Ray Diffraction....Pages 349-360 Back Matter....Pages 361-374 ....Pages 375-379 Traditionally the emphasis at each annual Denver X-ray Con ference is placed on a particular aspect of X-ray analysis. It is evident that portable X-ray analyzers are finding more and more applications outside the conventional boundaries of X-ray spectrometry.