Advances in X-Ray Analysis : Volume 38

Accurate Modeling of Size and Strain Broadening in the Rietveld Refinement: The 'DoubleVoigt' Approach (D. Balzar). In vivo Xray Fluorescence of Lead and Other Toxic Trace Elements (D.R. Chettle). Xray Diffraction Analysis of PM10 Aerosols Extracted by Ultrasound (B.L. Davis, H. Chen). Total Electron Yield (TEY): A New Approach for Quantitative Xray Analysis (H. Ebel). Manufacture and Use of Setting Up Samples (F.R. Feret). Applied Crystallography in the Scanning Electron Microscope Using a CCD Detector (R.P. Goehner, J.R. Michael). Trace Analysis by TXRF (R.S. Hockett). An in situ XRD Technique for Annealing Investigations (D.E. Hoylman, S.C. Axtell). Adaptation of the EGS4 Monte Carlo Code for the Design of a Polarized Source for Xray Fluorescence Analysis of Platinum and Other Heavy Metals in vivo (D.G. Lewis). 3D Graphing of XRF Matrix Correction Equations (A.J. Klimasara). Environmental Factors Contributing to the Body Burden of Lead as Determined by in vivo Xray Fluorescence (S.J.S. Ryde). Investigation of Residual Stresses in a Sleeve Coldworked Lug Specimen by Neutron and Xray Diffraction (R. Lin). Picosecond Xray Diffraction: System and Applications (P.M. Rentzepis). The Characterization of Microtexture by Orientation Mapping (R.A. Schwarzer). 79 additional articles. Index. Content: Front Matter....Pages i-xxvi Dynamic Characterization in Advanced Manufacturing....Pages 1-8 Non-Invasive Temperature Measurements by Neutron Diffraction in Aero-Engine Components....Pages 9-20 Picosecond X-Ray Diffraction: System and Applications....Pages 21-33 Applications of Neutron Powder Diffraction in Materials Research....Pages 35-46 Accuracy in Quantitative X-Ray Powder Diffraction Analyses....Pages 47-57 The Impact of Background Function on High Accuracy Quantitative Rietveld Analysis (QRA): Application to NIST SRMs 676 and 656....Pages 59-68 Quantitative Phase Analysis Using the Whole-Powder-Pattern Decomposition Method: II. Solution Using External Standard Materials....Pages 69-73 An Analysis of the Effect of Different Instrumental Conditions on the Shapes of X-Ray Powder Line Profiles....Pages 75-82 Quantitative X-Ray Diffraction Analysis of Smectites: I—Mass Attenuation Calculations for Smectite Analyses....Pages 83-90 X-Ray Diffraction Analysis of PM-10 Aerosols Extracted by Ultrasound....Pages 91-97 JCPDS—International Centre for Diffraction Data Low-AngLe Powder Diffraction Study of Silver Behenate....Pages 99-105 Upgrading Sulfide Mineral Patterns for the ICDD Powder Diffraction File....Pages 107-115 A Full-Trace Database for the Analysis of Clay Minerals....Pages 117-125 Determination of Thickness and Composition of Thin AlxGa1?XAs Layers on GaAs By Total Electron Yield (Tey)....Pages 127-137 Nondestructive Characterization of Multilayer Thin Films By X-Ray Reflectivity....Pages 139-143 Least-Squares Refinement of X-Ray Reflectivity Data Obtained With a Conventional Powder Diffractometer....Pages 145-150 Diffraction Space Mapping of Heteroepitaxial Layers....Pages 151-164 X-Ray Rocking Curve Analysis of Strained Heterointerfaces and Quantum Wells....Pages 165-174 Interfaces and Strain in IngaAsp/InP Heterostructures Assessed With Dynamical Simulations of High-Resolution X-Ray Diffraction Curves....Pages 175-180 High Resolution X-Ray Diffractometry and Topography of Float-Zone GaAs Crystals Grown in Microgravity....Pages 181-193 Reciprocal Space Mapping of Epitaxial Materials Using Position-Sensitive X-Ray Detection....Pages 195-200 Real Time Synchrotron Topography Using a Cid Array Camera With Digital Image Acquisition and Processing....Pages 201-213 Homogeneous Strain Relaxation and Mosaic Spread in IngaAs/GaAs Heterostructures Using Triple Axis Diffractometry....Pages 215-219 Application of Line Modified-Asymmetric Crystal Topography For Qualitative and Quantitative Evaluation of Integrated Circuits....Pages 221-226 Fluorine Implantation and Residual Stresses in Polysilicon Films....Pages 227-234 In-Situ Study of Dynamic Structural Rearrangements During Stress Relaxation....Pages 235-242 Determination of Z-Profiles of Diffraction Data from ?-Profiles Using A Numerical Linear Inversion Method....Pages 243-254 Comparison of Inverse Laplace and Numerical Inversion Methods for Obtaining Z-Depth Profilesof Diffraction Data....Pages 255-262 Determination of Composition and Phase Depth-Profiles in Multilayer and Gradient Solid Solution Photovoltaic Films Using Grazing Incidence X-Ray Diffraction....Pages 263-268 Computational (?,?) X-Ray Diffractometry for Single Crystal Analysis....Pages 269-276 Synchrotron X-Ray Microbeam Characteristics for X-Ray Fluorescence Analysis....Pages 277-282 Description of X-Ray Tube Spectra by the Depth Distribution Function of Pochou and Pichoir....Pages 283-289 Effect of X-Ray Tube Window Thickness on Detection Limits for Light Elements in XRF Analysis....Pages 291-298 The Study of Some Peculiar Phenomena in Ultra-Soft X-Ray Measurements Using Synthetic Multilayer Crystals....Pages 299-305 Development of a High Sensitivity TXRF with a Novel Monochromator Having Three Selectable Crystals....Pages 307-312 Combined Xrd and Xrf Analysis for Portable and Remote Applications....Pages 313-317 Total Electron Yield (TEY) a New Approach for Quantitative X-Ray Analysis....Pages 319-324 Manufacture and Use of Setting Up Samples....Pages 325-335 Standard XRF Analytical Methods for the Mining, Mineral Processing and Metallurgy Industry....Pages 337-351 A Novel Dumond Monochromator for High-Resolution X-Ray Diffraction....Pages 353-359 A New High Dynamic Range X-Ray Detector....Pages 361-369 Automated Measurement of Grain Orientations and On-Line Determination of Complete Deformation Systems with A TEM....Pages 371-376 Scanning X-Ray Apparatus for Crystal Texture Mapping and Micro-Fluorescence Analysis....Pages 377-381 An Evaluation of Deconvolution Techniques in X-Ray Profile Broadening Analysis and the Application of the Maximum Entropy Method to Alumina Data....Pages 383-385 Accurate Modeling of Size and Strain Broadening in the Rietveld Refinement: the “Double-Voigt” Approach....Pages 387-395 Detection and Modelling of Micro-Crystallinity by Means of X-Ray Powder Diffractometry....Pages 397-404 Line Profile Analyses of Rhodium Metal Obtained by Decomposition of Rhodium Carbonyl....Pages 405-412 X-Ray Fractographic Study on TiAI Alloys with Various Types of Microstructures....Pages 413-425 X-Ray Fractographic Study on Fracture Surface of New Light Metal....Pages 427-434 X-ray Fractography On Fatigue Fractured Surface Of Austenitic Stainless Steel....Pages 435-442 Investigation of Residual Stresses in a Sleeve Coldworked Lug Specimen by Neutron and X-Ray Diffraction....Pages 443-453 The Influence of Stress Gradient on X-Ray Stress Measurement....Pages 455-461 Residual Stress in Ion Implanted Titanium Nitride Studied by Parallel Beam Glancing Incidence X-Ray Diffraction....Pages 463-470 Separation of Internal Strains and Lattice Distortion Caused by Oxygen Impurities in Aluminum Nitride Hot-Pressed Ceramics....Pages 471-478 Real-Time X-Ray Scattering Of Binary Polymer Blends: Poly(Butylene Terephthalate)/Polycarbonate....Pages 479-487 Crystallinity and Unit Cell Variations in Linear High-Density Polyethylene....Pages 489-493 Use of a CCD-based Area Detection System on a Fibre Diffractometer....Pages 495-502 Using an Area Detector to Determine the Orientation Distribution Function....Pages 503-510 Generation of Crystallographic Packing Candidates with Fixed Helical Symmetry and Axial Advance: Application to PI-2 Polyimide....Pages 511-516 Real Time X-Ray Rheology of Polymers....Pages 517-529 Appllied Crystallography in the Scanning Electron Microscope Using a CCD Detector....Pages 531-537 The Characterisation of Microtexture by Orientation Mapping....Pages 539-545 A New Approach in Performing Microdiffraction Analysis....Pages 547-550 Analysis of Heterogeneous Materials With X-Ray Microfluorescence and Microdiffraction....Pages 551-556 Development of L-Line X-Ray Fluorescence Instrumentation and Its Applications to in-Vivo Measurement of lead in Bones....Pages 557-562 Adaptation of the Egs4 Monte Carlo Fode for the Design of a Polarized Source for X-Ray Fluorescence Analysis of Platinum and Other Heavy Metals in Vivo....Pages 563-572 Assaying Depleted Uranium in Bones In-Situ Using a Non-Invasive X-ray Fluorescence Technique....Pages 573-577 Skin Thickness Effects on in Vivo LXRF....Pages 579-585 Development of A Mercuric Iodide Detector Array for in Vivo X-Ray Imaging....Pages 587-594 Development of Bone-Lead Reference Materials for Validating in Vivo Xrf Measurements....Pages 595-599 Environmental Factors Contributing to the Body Burden of Lead as Determined by in Vivo X-Ray Fluorescence....Pages 601-606 In Vivo XRF Measurements of Heavy Elements: Summary of a Workshop....Pages 607-613 3-D Graphing of Xrf Matrix Correction Equations....Pages 615-624 Digital Spectrum Processing of the Characteristic K-Lines of the Lanthanides....Pages 625-632 Scattering Contributions to the Intensities of the Characteristic K-Lines of the Lanthanides....Pages 633-639 Improvement of the Smoothing Procedure Via Preliminary Logarithmic Transformation of the X-Ray Spectrum....Pages 641-648 Distortion of the Peak Shape Due to the Discrete Sampling of X-Ray Spectra....Pages 649-656 Trace Analysis by TXRF....Pages 657-663 Accurate Measurement of Trace Elements Using an Innovative Fixed Goniometer for a Simultaneous Spectrometer....Pages 665-671 Design of an X-Ray Fluorescence Sensor for the Cone Penetrometer....Pages 673-680 Characterization of the Tin Diffusion into Float Glass Using Glancing Angle X-Ray Characterization....Pages 681-686 Determination of Nitrogen and Other Elements in Plant Material by X-Ray Fluorescence....Pages 687-690 FPXRF, EDXRF and ICP Comparison of Pb Contaminated Soils from Leadville, Colorado....Pages 691-698 Quality Aspects in Selecting, Installing and Maintaining an Xrf Spectrometer....Pages 699-704 Specimen Preparation for X-Ray Fluorescence Analysis of Solutions....Pages 705-709 X-Ray Diffraction Study of BaNd2CuO5 at High Pressures....Pages 711-723 Re: Crystal Structures of Pyroaurite and Sj?grenite....Pages 725-729 An In SituXRD Technique For Annealing Investigations....Pages 731-733 Effect of Boron on the Amorphization of Zr–Ti–Ni–Cu Alloy....Pages 735-739 Thermal Preparation Effects on the X-Ray Diffractograms of Compounds Produced During Flue Gas Desulfurization....Pages 741-747 Back Matter....Pages 749-755 ....Pages 757-762