Advances in X-Ray Analysis : Volume 31

Content: Front Matter....Pages i-xvii Microdiffraction with Synchrotron Beams (or Ultra-High Pressure Research)....Pages 1-7 Microstructural and Chemical Analysis using Electron Beams: The Analytical Electron Microscope....Pages 9-24 X-ray Imaging of Surface and Internal Structure....Pages 25-34 X-ray Imaging: Status and Trends....Pages 35-52 Secondary Ion Mass Spectrometry and Related Techniques....Pages 53-58 X-ray Microscopy using Collimated and Focussed Synchrotron Radiation....Pages 59-68 Imaging with Spectroscopic Data....Pages 69-75 Small Area X-ray Diffraction Techniques; Errors in Strain Measurement....Pages 77-85 Elemental and Phase Mapping of Sputtered Binary Plutonium Alloys....Pages 87-92 An Automated X-ray Microfluorescence Materials Analysis System....Pages 93-98 Industrial Applications of X-ray Computed Tomography....Pages 99-105 Correlations between X-ray Microstructures and Magnetic Properties of CoCrTa Alloy Thin Films....Pages 107-112 Defect Structure of Synthetic Diamond and Related Phases....Pages 113-128 Microstructural Characterization of Thin Polycrystalline Films by X-ray Diffraction....Pages 129-142 Automated X-ray Topography and Rocking Curve Analysis: A Realiability Study....Pages 143-154 Grazing Incidence X-ray Scattering Studies of Single Quantum Wells....Pages 155-160 Dynamical Theory of Asymmetric X-ray Diffraction for Strained Crystal Wafers....Pages 161-165 Dynamical X-ray Diffraction Simulations for Asymmetric Reflections for III-V Semiconductors Multilayers....Pages 167-173 Simultaneous Determination of the Thickness and Composition of Thin Film Samples using Fundamental Parameters....Pages 175-180 The ?-Integral Method for X-ray Residual Stress Measurements....Pages 181-190 Oscillations in Interplanar Spacing vs. Sin2? a Fem Analysis....Pages 191-204 Focusing Circle Errors in X-ray Residual Stress Measurements of Nickel-Based Materials....Pages 205-212 Residual Stress Analysis in Steels Having Preferred Orientation by use of Synchrotron Radiation Source....Pages 213-222 Macro and Micro-Stress Distributions in Filled Epoxy Systems....Pages 223-230 Residual Stress Determination in Al2O3/SiC (Whisker) Composites by X-ray Diffraction....Pages 231-243 A Comparison of Diffraction Elastic Constants of Steel Measured with X-rays and Neutrons....Pages 245-253 Residual Stress in Two Dental Alloys During Porcelain Application....Pages 255-260 Pre-Cracking Technique and its Application to X-ray Fractography of Alumina Ceramics....Pages 261-268 X-ray Fractography of Stress Corrosion Cracking in AISI 4340 Steel Under Controlled Electrode Potential....Pages 269-276 A New Method for Evaluating X-ray Diffraction Peak Broadening with Engineering Applications....Pages 277-286 X-ray Line Broadening Study on Shock-Modified Hematite....Pages 287-294 Problems and Solutions in Quantitative Analysis of Complex Mixtures by X-ray Powder Diffraction....Pages 295-308 Preliminary Results from a Powder Diffraction Data Intensity Round-Robin....Pages 309-315 The Estimation of Limits of Detection in RIM Quantitative X-ray Diffraction Analysis....Pages 317-323 Automated Quantitative Multiphase Analysis using a Focusing Transmission Diffractometer in Conjunction with a Curved Position Sensitive Detector....Pages 325-330 X-ray Diffraction Analysis of Fly Ash....Pages 331-342 Measuring Graphitic Carbon and Crystalline Minerals in Coals and Bottom Ashes....Pages 343-349 High Temperature Stability of Superconducting YBa2CU3Ox as Characterized by X-ray Diffraction....Pages 351-357 X-Ray Study of the BaO-Y2O3-CuOx System....Pages 359-370 Comparison of calculated and experimental powder X-ray Diffraction patterns of organic materials....Pages 371-376 Neutron Diffraction — A Probe for Grain Size and Preferred Orientation in Zircaloy-Clad Uranium....Pages 377-384 Applications of Pulsed Neutron Powder Diffraction to Actinide Elements....Pages 385-393 Asymmetric Crystals Re-Visited....Pages 395-401 A 4 Crystal Monochromator for High Resolution Rocking Curves....Pages 403-408 Laser Aligned Laue Technique for Small Crystals....Pages 409-411 A Novel X-Ray Powder-Diffractometer, Measuring Preferred-Orientations....Pages 413-421 Using Digitized X-ray Powder Diffraction Scans as Input for a New PC-AT Search/Match Program....Pages 423-430 PC Based Topography Technique....Pages 431-438 X-ray Fluorescence Analysis of Alloy and Stainless Steels Using a Mercuric Iodide Detector....Pages 439-444 X-ray Fluorescence Spectrometry with Gas Proportional Scintillation Counters....Pages 445-448 Advances and Enhancements in Light Element EDXRF....Pages 449-454 Window Area Effects in the Detector Efficiency for Source Excited EDXRF Geometries....Pages 455-459 A New Analysis Principle for EDXRF: The Monte Carlo - Library Least-Squares Analysis Principle....Pages 461-469 Defining and Deriving Theoretical Influence Coefficients in XRF Spectrometry....Pages 471-478 Appearance Potential X-ray Fluorescence Analysis....Pages 479-486 Near-Surface Analysis of Semiconductor Using Grazing Incidence X-ray Fluorescence....Pages 487-494 A Scanning X-ray Fluorescence Microprobe with Synchrotron Radiation....Pages 495-502 Correction Method for Particle-Size Effect in XRF Analysis of Ore Slurries....Pages 503-506 Intensity and Distribution of Background X-rays in Wavelength Dispersive Spectrometry....Pages 507-514 Back Matter....Pages 515-523