Advances in X-Ray Analysis : Volume 30

The 35th Annual Denver Conference on Applications of X-Ray Analysis was held August 4-8, 1986, on the campus of the University of Denver. Since the previous year's conference had emphasized x-ray diffraction, this year the Plenary Session spotlighted x-ray fluorescence, with the title "Trends in XRF: A World Perspective," featuring renowned speakers from three major areas. XRF IN NORTH AMERICA, by Prof. D. E. Leydon, from Colorado State University, dealt specifically with developments in the fields of instrumentation, data treatment and applications in that part of the world. Prof. H. Ebel, from the Technical University of Vienna, discussed XRF IN EUROPE, concentrating on subjects including total reflection, improved fundamental parameters, quantitation without standards and imaging techniques. Tomoya Arai, of the Rigaku Industrial Corporation in Japan, in considering XRF IN THE FAR EAST, described the scientific activity in XRF and the applications thereof, primarily in Japan and China. These plenary lectures were interspersed with short discussions of PERSONAL OBSERVATIONS on the subject by the co-chairmen of the SeSSion, Ron Jenkins and myself. The intent of this session was to bring the audience up-to-date on the status of the field in various parts of the world, and to give some feeling concerning where it is likely to go in the immediate future. Hopefully, the publication of the written versions of those presentations in this volume will make the authors' thoughts available to many who could not be present at the conference. Content: Front Matter....Pages i-xviii XRF In North America....Pages 1-5 X-Ray Fluorescence Analysis (XRF) in Europe....Pages 7-11 XRF in Japan and China....Pages 13-27 Personal Observations....Pages 29-33 Personal Observations on Trends in XRF....Pages 35-37 X-Ray Microfluorescence of Geologic Materials....Pages 39-44 Parameters Affecting X-Ray Microfluorescence (XRMF) Analysis....Pages 45-51 Imaging Techniques for X-Ray Fluorescence and X-Ray Diffraction....Pages 53-65 X-Ray Microanalysis for Alloy Design....Pages 67-75 High Spatial Resolution in X-Ray Fluorescence....Pages 77-83 Low Level Iodine Detection by TXRF in a Reactor Safety Simulation Experiment....Pages 85-88 Robotic Automation Applied to X-Ray Fluorescence Analysis....Pages 89-96 Advances in Fundamental-Parameter Methods for Quantitative XRFA....Pages 97-104 X-Ray Fluorescence Analysis of Geological Materials using Rousseau’s Fundamental Algorithm....Pages 105-112 Application of the Inverse Monte Carlo Method to Energy-Dispersive X-Ray Fluorescence....Pages 113-120 Monte Carlo Simulation of the X-Ray Fluorescence Spectra from Multielement Homogeneous and Heterogeneous Samples....Pages 121-132 Quantitative Analysis of Odd-Shaped Samples by X-Ray Fluorescence Spectrometry using Intensity Ratios....Pages 133-141 Background Intensities and their Utilization in Quantitative Analysis by Monochromatically Excited Energy-Dispersive X-Ray Fluorescence....Pages 143-151 Standardless EDXRF Analysis of Cations in Ion-Exchange Resin-Impregnated Membrances....Pages 153-163 Use of Scattered Secondary Target Radiation in EDXRF Analysis: A Fundamental-Parameter Method for Matrix Correction....Pages 165-174 Comparison of Dilution Strategies for Dealing with Unanalyzed Elements in X-Ray Fluorescence Analysis....Pages 175-182 The use of Layered Synthetic Microstructures for Quantitative Analysis of Elements: Boron to Magnesium....Pages 183-192 The Analysis of Carbon and Other Light Elements using Layered Synthetic Microstructures....Pages 193-200 Layered Synthetic Microstructure in Sequential and Simultaneous X-Ray Spectrometry....Pages 201-211 Measurement of Soft and Ultrasoft X-Rays with Total Reflection Monochromator....Pages 213-223 Comparison of Dual-Channel Wavelength and Secondary-Target Energy-Dispersive X-Ray Spectrometers....Pages 225-236 The Efficiency of the Recessed Source Geometry for EDXRF Analysis of Metal Impurities in Oils....Pages 237-241 X-Ray Fluorescence Analysis of Sulfur and Trace Elements in Coal and Oil Tar Pitches, Asphalts and Other Bituminous Compounds....Pages 243-249 A Comparison of Several Sample Preparation Techniques for the Analysis of Fly Ash....Pages 251-256 Advances in High-Resolution Studies of the Chemical Effects in the Molybdenum L Heavy-Ion-Induced X-Ray Satellite Emission (HIXSE) Spectra....Pages 257-264 Energy Dispersive Analysis for Quality Assurance of Aluminum Alloys....Pages 265-272 Multielement Preconcentration of Rare Earth Elements for their Determination at ppm-Levels in Geological Samples....Pages 273-280 Wide Area Networking of XRF Generated Geochemical Data in a National Geological Survey....Pages 281-284 Energy-Dispersive X-Ray Techniques for Accurate Heavy Element Assay....Pages 285-292 Applications for X-Ray Fluorescence Scans of Single Strands of Hair: Actual and Potential....Pages 293-302 Application of EDXRF Analysis to Continuous Industrial Process Monitoring....Pages 303-307 X-Ray Fluorescence Determination of Trace Elements in Complicated Matrices....Pages 309-314 An X-Ray Fluorescent Spectrometer for the Measurement of Thin Layered Materials on Silicon Wafers....Pages 315-323 Automated Quantitative XRF Analysis of Soda-Lime Glass Utilizing Pattern Recognition....Pages 325-332 The use of Mass Absorption in Quantitative X-Ray Diffraction Analysis....Pages 333-342 Powder Diffraction Profiles and the Pearson VII Distribution....Pages 343-350 Observed and Calculated XRPD Intensities for Single Substance Specimens....Pages 351-356 Rapid Non-Destructive X-Ray Characterization of Solid Fuels/ Propellants....Pages 357-365 On-Stream X-Ray Diffraction Analyzer for Mineral Concentrators....Pages 367-372 Lattice Parameter Determination using Synchrotron Powder Data....Pages 373-382 Synchrotron Radiation Applied to Computer Indexing....Pages 383-388 Synchrotron X-Ray Scattering for the Structural Characterization of Catalysts....Pages 389-394 Thermal Expansion Behavior of Pure and Doped Cordierite by Time-of-Flight Neutron Diffraction....Pages 395-405 Instrumental Capabilities in X-Ray Diffraction Analysis: Comparative Techniques....Pages 407-412 A New High-Temperature Camera for Diffraction Studies Above 2200°C....Pages 413-420 Use of X-Ray Curved Sensitive Position Detector for Simultaneous Measurement of Several Pole Figures....Pages 421-427 A Quantitative Texture Analysis of Pluri-Crystals by Texture Goniometry....Pages 429-437 Computing X-Ray Powder Diffraction Intensities and Bragg Angles Using a Microcomputer....Pages 439-446 The Effects of Extinction on X-Ray Powder Diffraction Intensities....Pages 447-456 Analysis of Surface Layers and Thin Films by Low Incident Angle X-Ray Diffraction....Pages 457-464 X-Ray Diffraction Studies Under Non-Ambient Conditions: Application to Transition-Metal Dichalcogenide Solid Lubricants....Pages 465-471 High Temperature X-Ray Diffraction Study of Sol-Gel Derived Pb(ZrxTi1-x)03 Powders....Pages 473-481 In Situ Crystallization Measurements on Fe-Zr Glasses using an Automated High-Temperature Diffractometer with a Position Sensitive Detector....Pages 483-491 Use of The Dow-Developed DSC/XRD/MS in the Study of Several Model Copper-Based Catalyst Systems....Pages 493-502 Relationship between Thermal Expansion and Crystal Chemical Parameters in Diborides....Pages 503-510 Experimental Methods for Determination of Precision and Estimation of Accuracy in XRD Residual Stress Measurement....Pages 511-521 Design of a Real-Time Two-Dimensional Residual Stress Analyzer....Pages 523-526 High Resolution Digital X-Ray Rocking Curve Topography....Pages 527-535 X-Ray Diffraction Study of Fracture Surface Made by Fracture Toughness Tests of Blunt Notched CT Specimen of Aluminum Alloy....Pages 537-544 X-Ray Fractography of Fracture Surface of Alumina Ceramics....Pages 545-552 Dosimetry of X-Ray Beams: The Measure of the Problem....Pages 553-568 Some Examples of Failure in X-Ray Safety....Pages 569-573 Controlling Laboratory Conditions: Preventing the Problem, the Health Physicist’s Viewpoint....Pages 575-582 Analytical X-Ray Safety at Lawrence Livermore National Laboratory....Pages 583-594 Back Matter....Pages 595-602